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Power Management, DC/DC

AHV85110 and AMT49502 – GaN and MOSFET Gate Driver Solutions

Overview

AHV85110 – Isolated GaN Gate Driver

The AHV85110 is a compact, isolated gate driver tailored for high-frequency GaN FET applications. It eliminates the need for bootstrap biasing through integrated isolated power delivery, making it ideal for compact, efficient high-voltage systems. Operating at 350 kHz, the device drives both high-side and low-side GaN switches in a half-bridge configuration. It supports a 48 V input and includes a 12 V on-board regulator for the gate drive supply. Its isolated design ensures robust high-speed switching and reduced EMI in high-performance power systems.

 

AMT49502 – Automotive MOSFET Gate Driver

The AMT49502 is an automotive-grade half-bridge MOSFET gate driver designed for 100 kHz switching operations. It integrates cross-conduction protection, under-voltage lockout, and thermal features, making it well-suited for traditional MOSFET-based designs. Operating from the same 48 V input, it includes a 5 V on-board logic supply and interfaces easily with external PWM signals from an MCU. It provides reliable, efficient switching for automotive and industrial converters.

 

Introduction to the Demo Board

The evaluation platform consists of two sections on a single PCB:

  • GaN Section:
    • 2 – AHV85110 gate drivers (high-side and low-side)
    • Half-bridge GaN stage driven at 350 kHz
  • MOSFET Section:
    • An AMT49502 half-bridge driver
    • Half-bridge MOSFET stage driven at 100 kHz

The board operates from a 48 V DC input, and includes on-board regulators to generate the 12 V and 5 V supplies required by the AHV85110 and AMT49502 respectively.
PWM control is supplied from an external MCU (e.g., Teensy 4.0), with manual or MCU-based enable/disable control options.

 

Gate Driver Evaluation Lab Overview

Measuring Efficiency Across Load Range

Users can perform an efficiency sweep by incrementing the load current in 0.5 A steps from 0.5 A to 3 A, helping visualize power delivery performance.

Analyzing Switching Node Waveform

At a fixed load of 3 A, users can capture and analyze real-time waveforms at the half-bridge switching nodes to observe rise/fall times, switching performance, overshoot behaviors and deadtime.

Performing Thermal Profiling

Thermal testing enables users to apply a constant load current (1–3 A) and monitor heat buildup via a thermal camera.

Capabilities

  • Sweep output current from 0.5 A to 3 A.
  • Oscilloscope integration to capture switching node waveforms.
  • Thermal camera to visualise the thermal performance of the board.
  • Dedicated microcontroller to generate 350 kHz and 100 kHz PWM.

Features

  • Validate the efficiency of the board.
  • Observe and validate the rise/fall time and dead time of GaN and MOSFET gate drivers.
  • Evaluate the Thermal performance of the board.
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